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Dongguan Kingpo Technology Limited

Dongguan Kingpo Technology Limited

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Home / Products / Test Finger Probe / IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders /

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IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders
IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders
  • IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders
  • IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders
  • IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders
Products Detailed
Product Details Product details: The wedge probe is a new accessibility probe required by the standard of IEC 60950-1 Fig NAF.2(S5366) and NAF.3(S5370...
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